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Investigator Profiles

Project Overview

Task 1: Theoretical & Experimental Study of Defects

Task 2: Innovative Growth and Fabrication Processes for Defect Reduction

Task 3: Evaluation of Defect Reduction Approaches and Device Applications

Broader Impact

Kickoff Meeting

Kickoff Documents (Restricted)

2011 Annual Review (Restricted)

Investigator Profiles

Name: S. L. Chuang

School:
UIUC

Major Project Research Tasks: Device modeling, fabrication, passivation, EBIC, FTIR characterization, DLTS, CV, certical transportation
Name: K. C. Hsieh

School:
UIUC


Major Project Research Tasks: TEM, STM, XPS, AES depth profiling, SIMS

Name: Jian-Min Zuo

School:
UIUC


Major Project Research Tasks: TEM, STM, XPS, AES depth profiling, SIMS

Name: Y.-H. Zhang

School:
ASU


Major Project Research Tasks: MBE, InAs/InAsSb, device characterization, new device designs

Name: S. R. Johnson

School:
ASU


Major Project Research Tasks: MBE growth and in-situ monitoring of InAs/InGaSb and InAs/InAsSb

Name: D. J. Smith

School:
ASU


Major Project Research Tasks: EM, Z-contrast and holographic TEM, STEM, EELS
Name: R. D. Dupuis

School:
Georgia Tech


Major Project Research Tasks: MOCVD growth, structural characterization

Name: Y. Zhang

School:
UNCC


Major Project Research Tasks: Theory and characterization of defects and electronic structures
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